An implementation of the Partition Of variation (POV) method as developed by Dr. Thomas A Little <https://thomasalittleconsulting.com> in 1993 for the analysis of semiconductor data for hard drive manufacturing. POV is based on sequential sum of squares and is an exact method that explains all observed variation. It quantitates both the between and within factor variation effects and can quantitate the influence of both continuous and categorical factors.
|Depends:||R (≥ 2.10)|
|Imports:||broom, formula.tools, stats|
|Suggests:||testthat, knitr, rmarkdown|
|Author:||Paul Deen [aut, cre]|
|Maintainer:||Paul Deen <paulext at gmail.com>|
|CRAN checks:||POV results|
|Windows binaries:||r-devel: POV_0.1.4.zip, r-release: POV_0.1.4.zip, r-oldrel: POV_0.1.4.zip|
|macOS binaries:||r-release (arm64): POV_0.1.4.tgz, r-oldrel (arm64): POV_0.1.4.tgz, r-release (x86_64): POV_0.1.4.tgz, r-oldrel (x86_64): POV_0.1.4.tgz|
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